Abstract
Introduction. Background on emerging technologies. Why PCM?
Device level description of PCM. Strategies for writing to multi-bit PCM cells.
Systems with PCM (hybrid memory, PCM-only main memory) and some key challenges in their realization.
Wear leveling and survey of existing solutions.
Mitigating the performance impact of slow writes.
Solid State Drives: Opportunities & Challenges. How does PCM help?
Summary and discussion of open research topics.
Bio of Organizers/Presenters
Dr. Moinuddin Qureshi is a
Research Staff Member at IBM T.J. Watson Research Center. His research
interest includes scalable high-performance and power-efficient memory
systems. His recent research work includes hybrid memory system using PCM
(ISCA’09) and efficient wear leveling for PCM (MICRO’09). He has published
more than a dozen papers in architecture conferences and holds three US
patents. He received his PhD from the University of Texas at Austin in 2007.
Dr. Sudhanva Gurumurthi is an Assistant Professor in the Computer
Science Department at the University of Virginia. Sudhanva's research
interests include storage systems and silicon reliability. His contributions
to storage systems includes Dynamic RPM drives (ISCA'03), Intra-Disk
Parallelism (ISCA'08, IEEE Micro Top Picks'09), and power and temperature
modeling of storage systems (ISCA'05, HPCA'06, DAC'07). He is serving or has
served on the Program Committees of several top systems conferences
including ISCA, ASPLOS, FAST, and SIGMETRICS. He received his BE from the
College of Engineering Guindy in 2000 and his PhD from Penn State in 2005
and has held research positions at the IBM Austin Research Lab and Intel
Corporation. Sudhanva received the NSF CAREER Award in 2007. He is a member
of the ACM and the IEEE.
Dr. Bipin Rajendran
is a Research
Staff Member at IBM T.J. Watson Research Center. At IBM, he is involved in
exploratory research on Phase Change Memory, involving process integration,
device modeling and electrical characterization. He has contributed to works
that led to the demonstration of the most advanced multi-level demonstration
in PCM (Nirschl et al, IEDM '07), universal metrics for reliability
characterization of PCM (Rajendran et al, VLSI Technology Symposium '08),
analytical model for PCM operation (Rajendran et al, IEDM '08) and PCM data
retention models (Y.H Shih et al, IEDM '08). He has published more than 25
papers in peer reviewed journals and conferences, and has been issued 2 US
patents. He received a B.Tech degree (in 2000) from Indian Institute of
Technology, Kharagpur and M.S (in 2003) and Ph.D (in 2006) from Stanford
University.